Systematic compositional analysis of sputter-deposited boron-containing thin films

نویسندگان

چکیده

Boron-containing materials exhibit a unique combination of ceramic and metallic properties that are sensitively dependent on their given chemical bonding elemental compositions. However, determining the composition, let alone bonding, with sufficient accuracy is cumbersome respect to boron, being light element bonds in various coordinations. Here, we report comprehensive compositional analysis transition-metal diboride (TMBx) thin films (TM = Ti, Zr, Hf) by energy-dispersive x-ray spectroscopy (EDX), photoelectron (XPS), time-of-flight elastic recoil detection (ToF-ERDA), Rutherford backscattering spectrometry (RBS), nuclear reaction (NRA). The grown Si C substrates dc magnetron sputtering from stoichiometric TMB2 targets have hexagonal AlB2-type columnar structures. EDX considerably overestimates B/TM ratios, x, compared other techniques, particularly for ZrBx. B concentrations obtained XPS strongly depend energy Ar+ ions used removing surface oxides contaminants prior analyses more reliable 0.5 keV Ar+. ToF-ERDA, RBS, NRA yield consistent compositions TiBx. They also prove TiBx ZrBx be homogeneous comparable ratios each film. employing 36-MeV 127I8+ beam, exhibits challenges depth resolution quantification HfBx due plural multiple scattering associated loss straggling effects. Compared RBS (for film substrates) provide B/Hf ratios. Overall, methods recommended accurately pinpointing borides contain heavy transition metals.

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ژورنال

عنوان ژورنال: Journal of vacuum science & technology

سال: 2021

ISSN: ['2327-9877', '0734-211X']

DOI: https://doi.org/10.1116/6.0001234